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Impact of electron trap states on the transport properties of GeSn semiconducting heterostructures assessed by electrical characterizations

机译：通过电子表征评估电子陷阱态对GeSn半导体异质结构输运性质的影响

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Baert, Bruno;
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年度 2016
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正文语种 en
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Impact of electron trap states on the transport properties of GeSn semiconducting heterostructures assessed by electrical characterizations

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